WEKO3
アイテム
{"_buckets": {"deposit": "4bef7a25-eb31-4669-9927-189fc2a9d658"}, "_deposit": {"created_by": 3, "id": "17300", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "17300"}, "status": "published"}, "_oai": {"id": "oai:waseda.repo.nii.ac.jp:00017300", "sets": ["1595"]}, "author_link": ["28062", "28060", "28089"], "item_10001_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2003-09", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "223", "bibliographicPageStart": "211", "bibliographic_titles": [{"bibliographic_title": "Software Metrics Symposium, 2003. Proceedings, Ninth International"}]}]}, "item_10001_description_42": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"subitem_description": "text", "subitem_description_type": "Other"}]}, "item_10001_publisher_8": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Institute of Electrical and Electronic Engineers"}]}, "item_10001_relation_10": {"attribute_name": "ISBN", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "0769519873", "subitem_relation_type_select": "ISBN"}}]}, "item_10001_relation_43": {"attribute_name": "シリーズ", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "IEEE CNF"}]}]}, "item_10001_rights_15": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "Copyright: Institute of Electrical and Electronic Engineers (IEEE)"}]}, "item_10001_subject_21": {"attribute_name": "日本十進分類法", "attribute_value_mlt": [{"subitem_subject": "007.6406", "subitem_subject_scheme": "NDC"}]}, "item_10001_subject_33": {"attribute_name": "米国議会図書館件名標目", "attribute_value_mlt": [{"subitem_subject": "Computer software Quality control--Congresses", "subitem_subject_scheme": "LCSH"}]}, "item_10001_text_63": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_text_value": "http://hdl.handle.net/2065/822"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Washizaki, Hironori"}], "nameIdentifiers": [{"nameIdentifier": "28060", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "1000070350494", "nameIdentifierScheme": "NRID", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000070350494"}]}, {"creatorNames": [{"creatorName": "Yamamoto, Hirokazu"}], "nameIdentifiers": [{"nameIdentifier": "28089", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fukazawa, Yoshiaki"}], "nameIdentifiers": [{"nameIdentifier": "28062", "nameIdentifierScheme": "WEKO"}, {"nameIdentifier": "1000020165252", "nameIdentifierScheme": "NRID", "nameIdentifierURI": "https://nrid.nii.ac.jp/ja/nrid/1000020165252"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2016-11-25"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "01232469.pdf", "filesize": [{"value": "423.0 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 423000.0, "url": {"label": "01232469.pdf", "url": "https://waseda.repo.nii.ac.jp/record/17300/files/01232469.pdf"}, "version_id": "c93f4e10-7b72-4296-9181-23ac4322dc2e"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "A metrics suite for measuring reusability of software components", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "A metrics suite for measuring reusability of software components", "subitem_title_language": "en"}]}, "item_type_id": "10001", "owner": "3", "path": ["1595"], "permalink_uri": "http://hdl.handle.net/2065/822", "pubdate": {"attribute_name": "公開日", "attribute_value": "2008-04-23"}, "publish_date": "2008-04-23", "publish_status": "0", "recid": "17300", "relation": {}, "relation_version_is_last": true, "title": ["A metrics suite for measuring reusability of software components"], "weko_shared_id": -1}
A metrics suite for measuring reusability of software components
http://hdl.handle.net/2065/822
http://hdl.handle.net/2065/822ed2c9e27-eadd-49d4-a6c3-84160bb4e816
名前 / ファイル | ライセンス | アクション |
---|---|---|
01232469.pdf (423.0 kB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2008-04-23 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | A metrics suite for measuring reusability of software components | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Washizaki, Hironori
× Washizaki, Hironori× Yamamoto, Hirokazu× Fukazawa, Yoshiaki |
|||||
書誌情報 |
Software Metrics Symposium, 2003. Proceedings, Ninth International p. 211-223, 発行日 2003-09 |
|||||
関連情報 | ||||||
識別子タイプ | ISBN | |||||
関連識別子 | 0769519873 | |||||
権利 | ||||||
権利情報 | Copyright: Institute of Electrical and Electronic Engineers (IEEE) | |||||
日本十進分類法 | ||||||
主題 | 007.6406 | |||||
米国議会図書館件名標目 | ||||||
主題 | Computer software Quality control--Congresses | |||||
出版者 | ||||||
出版者 | Institute of Electrical and Electronic Engineers | |||||
資源タイプ | ||||||
内容記述 | text | |||||
関連情報 | ||||||
関連名称 | IEEE CNF |